Omron Swir Camera Technology
Make the Invisible Visible
Omron's new generation SWIR (Short-Wave Infrared) camera allows you to analyze material internal structure by going beyond visible light. Thanks to its sensor technology operating in the range of 900 nm – 1700 nm, it reveals the differences in the lower layers of opaque or translucent objects.
This camera, which redefines quality control in high-precision production lines such as food, pharmaceutical, electronics, semiconductor and automotive, provides excellent results together with Oacon's advanced image processing solutions.
Highlights
- SWIR Spectrum Sensitivity: It detects internal structures that visible light cameras cannot detect.
- High Dynamic Range: It clearly captures bright and dark areas in the same frame.
- Cooled Sensor Options: Stable signal level in long-term measurements.
- Compact Industrial Design: Easy integration into demanding production lines.
- GigE/USB3 Interfaces: Fully compatible with Omron FH image processing platforms.
Application Areas
- Moisture and dirt detection (food & pharmaceutical industries)
- Adhesive, coating or paint thickness control
- PCB and silicon wafer inspection (electronics manufacturing)
- Glass, plastic and fiber material analysis
- Material separation and classification
Make a Difference with Oacon Integration
Oacon offers the Omron SWIR camera not just as a camera, but as part of a complete measurement and analysis platform.
With smart software infrastructure and AI-supported image processing algorithms; We specifically integrate deep learning-based error classification and spectral analysis-based material separation features into the application.
Technical Specifications
| Feature | Value |
| Spectral Range | 400 – 1700 nm |
| resolution | 1,280(H)×1,024(V) px |
| Pixel Size | 5 µm |
| Frame Rate | up to 120fps |
| interface | GigE/USB3 |
| Lens Mount | C-Mount |
| Sensor Type | InGaAs |